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au.\*:("BALASUBRAMANIAN C")

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MOLECULAR FORCE FIELD ELLIPSES OF BORON TRIHALIDES.RADHAKRISHNAN M; BALASUBRAMANIAN C.1978; CZECHOSL. J. PHYS.; CZECHOSL.; DA. 1978; VOL. 28; NO 1; PP. 47-49; BIBL. 4 REF.Article

Energy efficiency in heat recovery systemBALASUBRAMANIAN, C.Chemical engineering world. 2000, Vol 35, Num 3, pp 73-74, issn 0009-2517Article

DEPENDENCE OF DEFECT DENSITY AND ACTIVATION ENERGY ON DEPOSITION RATES IN COPPER FILMSNARAYANDAS K; RADHAKRISHNAN M; BALASUBRAMANIAN C et al.1981; J. MATER. SCI.; ISSN 0022-2461; GBR; DA. 1981; VOL. 16; NO 2; PP. 549-552; BIBL. 14 REF.Article

AN INEXPENSIVE DIGITAL CRYSTAL THICKNESS MONITORBALASUBRAMANIAN A; RADHAKRISHNAN M; BALASUBRAMANIAN C et al.1981; J. PHYS. E; ISSN 0022-3735; GBR; DA. 1981; VOL. 14; NO 1; PP. 123-126; BIBL. 19 REF.Article

FREQUENCY CHARACTERISTICS OF THERMALLY EVAPORATED STEARIC ACID FILMSKASILINGAM AR; BALASUBRAMANIAN C; RADHAKRISHNAN M et al.1980; PHYS. STATUS SOLIDI (A), APPL. RES.; ISSN 0031-8965; DDR; DA. 1980; VOL. 57; NO 1; PP. K35-K39; BIBL. 20 REF.Article

ANNEALING EFFECT ON SILVER-TELLURIUM FILMSNARAYANDAS K; RADHAKRISHNAN M; BALASUBRAMANIAN C et al.1978; PHYS. STATUS SOLIDI, A; DDR; DA. 1978; VOL. 49; NO 2; PP. K213-K215; BIBL. 8 REF.Article

ELECTRICAL CONDUCTION AND BREAKDOWN PROPERTIES OF SILICON NITRIDE FILMSMANGALARAJ D; RADHAKRISHNAN M; BALASUBRAMANIAN C et al.1982; J. MATER. SCI.; ISSN 0022-2461; GBR; DA. 1982; VOL. 17; NO 5; PP. 1474-1478; BIBL. 36 REF.Article

EFFECT OF VACUUM ON EVAPORATED STEARIC ACID FILMSKASILINGAM AR; BALASUBRAMANIAN C; RADHAKRISHNAN M et al.1980; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1980; VOL. 70; NO 1; PP. 169-174; BIBL. 25 REF.Article

DIELECTRIC BEHAVIOUR OF LANTHANUM OXIDE THIN FILM CAPACITORSMAHALINGAM T; RADHAKRISHNAN M; BALASUBRAMANIAN C et al.1981; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1981; VOL. 78; NO 3; PP. 229-233; BIBL. 16 REF.Article

AC ELECTRICAL CONDUCTIVITY OF SMF3 THIN FILMSMAHALINGAM T; RADHAKRISHNAN M; BALASUBRAMANIAN C et al.1981; J. NON-CRYST. SOLIDS; ISSN 0022-3093; NLD; DA. 1981; VOL. 44; NO 2-3; PP. 401-404; BIBL. 13 REF.Article

AMNEALING STUDY OF THE ELECTRICAL RESISTIVITY AND DEFECT DENSITY IN SILVER FILMSNARAYANDAS K; RADHAKRISHNAN M; BALASUBRAMANIAN C et al.1978; PHYS. STATUS SOLIDI, A; DDR; DA. 1978; VOL. 48; NO 1; PP. K71-K74; BIBL. 11 REF.Article

ELECTRICAL PROPERTIES OF ELECTRON-BEAM-EVAPORATED INDIUM OXIDE THIN FILMSBALASUBRAMANIAN A; RADHAKRISHNAN M; BALASUBRAMANIAN C et al.1982; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1982; VOL. 91; NO 1; PP. 71-79; BIBL. 38 REF.Article

ELECTRICAL CONDUCTION OF LAF3 THIN FILMSMAHALINGAM T; RADHAKRISHNAN M; BALASUBRAMANIAN C et al.1981; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1981; VOL. 78; NO 3; PP. 245-249; BIBL. 21 REF.Article

AC CONDUCTION IN TERBIUM FLUORIDE THIN FILMSPARAMASIVAM KR; RADHAKRISHNAN M; BALASUBRAMANIAN C et al.1980; PHYS. STATUS SOLIDI (A), APPL. RES.; ISSN 0031-8965; DDR; DA. 1980; VOL. 58; NO 1; PP. K67-K70; BIBL. 11 REF.Article

DIELECTRIC STUDIES ON TELLURIUM OXIDE THIN FILMSLAKSHMINARAYAN N; RADHAKRISHNAN M; BALASUBRAMANIAN C et al.1982; JOURNAL OF MATERIALS SCIENCE; ISSN 0022-2461; GBR; DA. 1982; VOL. 17; NO 6; PP. 1623-1626; BIBL. 29 REF.Article

ELECTRICAL PROPERTIES OF SAMARIUM FLUORIDE THIN FILMSMAHALINGAM T; RADHAKRISHNAN M; BALASUBRAMANIAN C et al.1980; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1980; VOL. 74; NO 1; PP. 29-34; BIBL. 17 REF.Article

THICKNESS DEPENDENCE OF DEFECT DENSITY IN SILVER FILMS = VARIATION AVEC L'EPAISSEUR DE LA DENSITE DE DEFAUTS DANS DES COUCHES MINCES D'ARGENTNARAYANDAS K; RADHAKRISHNAN M; BALASUBRAMANIAN C et al.1980; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1980; VOL. 67; NO 2; PP. 357-364; BIBL. 25 REF.Article

A STUDY ON VACUUM EVAPORATED STEARIC ACID FILMS FOR LOW-LOSS CAPACITORSKASILINGAM AR; BALASUBRAMANIAN C; RADHAKRISHNAM M et al.1980; J. PHYS. D; ISSN 0022-3727; GBR; DA. 1980; VOL. 13; NO 5; PP. 853-860; BIBL. 27 REF.Article

DIELECTRIC PROPERTIES OF LANTHANUM FLUORIDE THIN FILMSMAHALINGAM T; RADHAKRISHNAN M; BALASUBRAMANIAN C et al.1979; THIN SOLID FILMS; NLD; DA. 1979; VOL. 59; NO 2; PP. 221-229; BIBL. 26 REF.Article

DIELECTRIC AND AC CONDUCTION PROPERTIES OF ION PLATED ALUMINIUM NITRIDE THIN FILMSMANGALARAJ D; RADHAKRISHNAN M; BALASUBRAMANIAN C et al.1982; J. PHYS. D; ISSN 0022-3727; GBR; DA. 1982; VOL. 15; NO 3; PP. 467-472; BIBL. 20 REF.Article

ELECTRICAL CONDUCTION IN EVAPORATED TERBIUM FLUORIDE THIN FILMSPARAMASIVAM KR; RADHAKRISHNAN M; BALASUBRAMANIAN C et al.1981; J. MATER. SCI.; ISSN 0022-2461; GBR; DA. 1981; VOL. 16; NO 5; PP. 1183-1186; BIBL. 23 REF.Article

DEPENDENCE OF DEFECT DENSITY AND ACTIVATION ENERGY ON DEPOSITION RATES IN SILVER FILMSNARAYANDAS K; RADHAKRISHNAN M; BALASUBRAMANIAN C et al.1979; PHYS. STATUS SOLIDI (A), APPL. RES.; ISSN 0031-8965; DDR; DA. 1979; VOL. 56; NO 1; PP. 195-198; ABS. GER; BIBL. 14 REF.Article

CURRENT-VOLTAGE CHARACTERISTICS OF ALUMINIUM NITRIDE FILMS FORMED BY RF GLOW DISCHARGEMANGALARAJ D; RADHAKRISHNAN M; BALASUBRAMANIAN C et al.1980; J. PHYS. D; ISSN 0022-3727; GBR; DA. 1980; VOL. 13; NO 6; PP. L101-L105; BIBL. 13 REF.Article

DC CONDUCTION STUDIES IN ION PLATED TITANIUM OXIDE THIN FILMSBABUJI B; BALASUBRAMANIAN C; RADHAKRISHNAN N et al.1980; PHYS. STATUS SOLIDI (A), APPL. RES.; ISSN 0031-8965; DDR; DA. 1980; VOL. 60; NO 1; PP. K39-K42; BIBL. 13 REF.Article

Structural elucidation of novel derivatives of pyranobisquinolines 1H-NMR, 13C-NMR and mass spectroscopic study of (7H)-6,8-dichloro-7-methyl-pyrano(3,2-c:5,6-c')bisquinoline and (7H)-6,8-dichloro-7-methyl-pyrano (3,2-c:5,6-b')bisquinolineBALASUBRAMANIAN, C; MOHAN, P. S.Spectroscopy letters. 1993, Vol 26, Num 8, pp 1435-1442, issn 0038-7010Article

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